@article {31586,
	title = {Reliability of microelectronic devices from emitter-base junction characterisation},
	volume = {78},
	number = {5},
	year = {2005},
	pages = {65},
	author = {W. Tazib and N. Toufik and C. Salame and P. Mialhe and M.A. Belkhir}}
}
