Citation:
F.Djeffal, Abdi A, Dibi Z, M.Chahdi, Benhaya A. A neural approach to study the scaling capability of the undoped Double-Gate and cylindrical Gate All around MOSFETs. Materials Sciences &Engineering B [Internet]. 2007;pp.1111-1116, 27(5).
Faculté de Technologie, Département d'Électronique
Université Batna 2